Chinese Journal of Lasers, Volume. 51, Issue 18, 1801011(2024)
Inhomogeneity Distribution Nondestructive Testing of Microstrip Circuits Based on THz‑TDR
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Zhen Xu, Bohan Liang, Longhai Liu, Man Luo, Jining Li, Kai Zhong, Yuye Wang, Degang Xu. Inhomogeneity Distribution Nondestructive Testing of Microstrip Circuits Based on THz‑TDR[J]. Chinese Journal of Lasers, 2024, 51(18): 1801011
Category: laser devices and laser physics
Received: May. 9, 2024
Accepted: Jul. 9, 2024
Published Online: Sep. 9, 2024
The Author Email: Li Jining (xudegang@tju.edu.cn), Xu Degang (jiningli@tju.edu.cn)
CSTR:32183.14.CJL240860