Chinese Journal of Lasers, Volume. 51, Issue 18, 1801011(2024)

Inhomogeneity Distribution Nondestructive Testing of Microstrip Circuits Based on THz‑TDR

Zhen Xu1,2, Bohan Liang1, Longhai Liu1,2,3, Man Luo1,2, Jining Li1,2、*, Kai Zhong1,2, Yuye Wang1,2, and Degang Xu1,2、**
Author Affiliations
  • 1School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China
  • 2Key Laboratory of Opto-Electronic Information Technology (Ministry of Education), Tianjin University, Tianjin 300072, China
  • 3Advantest (China) Co., Ltd., Shanghai 201203, China
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    References(28)

    [1] Li Z F[M]. Microstrip circuit, 99-109(2017).

    [7] Zhang J, Lu X H, Zhu Z Y. Line laser lock-in thermal imaging detection of defects in multi-channel digital integrated chips[J]. Laser Journal, 43, 76-80(2022).

    [8] Xu Z, Xu D G, Liu L H et al. Metal microstrip line defect detection of chip based on THz-TDR technology[J]. Journal of Infrared and Millimeter Waves, 43, 359-368(2024).

    [9] Li X M. Difference measurement method and multi-point calibration technology research and software implementation in TDR[D], 5-6(2014).

    [14] Zhan L, Shi L, Xu W et al. Application of cable detection based on TDR technology in coal mine underground communication[J]. Industrial Control Computer, 36, 56-57, 61(2023).

    [22] Li J L, Wang Y L. Novel TDR inspection techniques and their application to IC package failure analysis[J]. Journal of Taiyuan University of Technology, 97-99, 118(2008).

    [26] Tang P F. Research and implementation of dual-channel differential TDR waveform processing technology[D], 7-9(2020).

    [27] Shen X L. Research on THz multilayer dielectric microstrip line[D], 11-12(2014).

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    Zhen Xu, Bohan Liang, Longhai Liu, Man Luo, Jining Li, Kai Zhong, Yuye Wang, Degang Xu. Inhomogeneity Distribution Nondestructive Testing of Microstrip Circuits Based on THz‑TDR[J]. Chinese Journal of Lasers, 2024, 51(18): 1801011

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    Paper Information

    Category: laser devices and laser physics

    Received: May. 9, 2024

    Accepted: Jul. 9, 2024

    Published Online: Sep. 9, 2024

    The Author Email: Li Jining (xudegang@tju.edu.cn), Xu Degang (jiningli@tju.edu.cn)

    DOI:10.3788/CJL240860

    CSTR:32183.14.CJL240860

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