Inhomogeneity Distribution Nondestructive Testing of Microstrip Circuits Based on THz‑TDR

Zhen Xu; Bohan Liang; Longhai Liu; Man Luo; Jining Li; Kai Zhong; Yuye Wang; Degang Xu

doi:10.3788/CJL240860

Chinese Journal of Lasers, Volume. 51, Issue 18, 1801011(2024)

Inhomogeneity Distribution Nondestructive Testing of Microstrip Circuits Based on THz‑TDR

Zhen Xu^1,2, Bohan Liang¹, Longhai Liu^1,2,3, Man Luo^1,2, Jining Li^1,2、*, Kai Zhong^1,2, Yuye Wang^1,2, and Degang Xu^1,2、**

Author Affiliations

¹School of Precision Instruments and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China

²Key Laboratory of Opto-Electronic Information Technology (Ministry of Education), Tianjin University, Tianjin 300072, China

³Advantest (China) Co., Ltd., Shanghai 201203, China

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Zhen Xu, Bohan Liang, Longhai Liu, Man Luo, Jining Li, Kai Zhong, Yuye Wang, Degang Xu. Inhomogeneity Distribution Nondestructive Testing of Microstrip Circuits Based on THz‑TDR[J]. Chinese Journal of Lasers, 2024, 51(18): 1801011

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Paper Information

Category: laser devices and laser physics

Received: May. 9, 2024

Accepted: Jul. 9, 2024

Published Online: Sep. 9, 2024

The Author Email: Jining Li (xudegang@tju.edu.cn), Degang Xu (jiningli@tju.edu.cn)

DOI:10.3788/CJL240860

CSTR:32183.14.CJL240860

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology