Chinese Journal of Lasers, Volume. 51, Issue 18, 1801011(2024)
Inhomogeneity Distribution Nondestructive Testing of Microstrip Circuits Based on THz‑TDR
Fig. 4. Microstrip circuit wire design diagrams (unit: mm). (a) Straight metallic wire; (b) metallic wire with branching lines; (c) square metallic spiral wire; (d) physical microstrip circuit
Fig. 5. Distribution of electric/magnetic field lines in the cross-section of metallic microstrip line
Fig. 6. Time-domain reflection signals of straight metallic wires with different lengths. (a) Straight metallic wire with length of 5 mm; (b) straight metallic wire with different lengths
Fig. 7. Reflected signals from the samples with 50 mm long main conductor and branch lines. (a) A sample with one branch line; (b) a sample with 2 branch lines; (c) samples with 2 and 3 branch lines
Fig. 8. Reflected signals from the samples with 100 mm long main conductor and branch lines. (a) A sample with 1 branch line; (b) a sample with 2 branch lines; (c) samples with 2 and 3 branch lines
Fig. 10. Error analysis. (a) Unevenness detection error versus length for different types of wires; (b) microscopic image of microstrip line
Fig. 11. Simulation of the inhomogeneity of different types of microstrip lines. (a) Different lengths of straight lines; (b) microstrip lines with different numbers of T-branch lines and different lengths of main conductor; (c) continuously bent line
Fig. 12. Microstrip line impedance discontinuity equivalent circuit. (a) T-branch line and its equivalent circuit; (b) bent wire and its equivalent circuit
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Zhen Xu, Bohan Liang, Longhai Liu, Man Luo, Jining Li, Kai Zhong, Yuye Wang, Degang Xu. Inhomogeneity Distribution Nondestructive Testing of Microstrip Circuits Based on THz‑TDR[J]. Chinese Journal of Lasers, 2024, 51(18): 1801011
Category: laser devices and laser physics
Received: May. 9, 2024
Accepted: Jul. 9, 2024
Published Online: Sep. 9, 2024
The Author Email: Li Jining (xudegang@tju.edu.cn), Xu Degang (jiningli@tju.edu.cn)
CSTR:32183.14.CJL240860