Chinese Optics Letters, Volume. 21, Issue 7, 071204(2023)

Improving accuracy and sensitivity of diffraction-based overlay metrology

Wenhe Yang1,2, Nan Lin1,2、*, Xin Wei1,2, Yunyi Chen1,2, Sikun Li2, Yuxin Leng2, and Jianda Shao2、**
Author Affiliations
  • 1School of Microelectronics, Shanghai University, Shanghai 200072, China
  • 2Department of Precision Optics Engineering, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    Figures & Tables(8)
    (a) The microscopic picture of modern CPU chip[18] is on the left, and a close section of the two-layer structure is on the right. (b) Signal formation in DBO schematic diagram[19,20]; α is proportional to OVL Δl; β is the phase shift due to the optical path difference between the two diffracted beams, and its value is twice the distance difference between the bottom and top gratings.
    Cross-sectional diagram of OVL mark (the bottom grating profile is parabolic).
    Cross-sectional diagram of OVL mark (the bottom grating profile is linearly deformed).
    Variation of error signal with slope w under different orders of diffracted light.
    Cross-sectional diagram of OVL mark (both top and bottom grating profiles are linearly deformed).
    Variation of error signal with amplitude ratio η under different orders of diffracted light. (a) The bottom and top gratings are tilted in the opposite direction (the absolute value of γ is greater than the absolute value of ε), ε = 0.005, γ = −0.01. (b) The bottom and top gratings are tilted in the same direction, ε = 0.005, γ = 0.01.
    Variation of the absolute of function F (ε, γ) with the slope of the top grating ε and bottom grating γ. (a) n = 1; (b) n = 2.
    Variation of 32η*F (ε, γ) (which is defined as F1) with respect to the amplitude ratio η for different orders of diffracted light (the bottom and top gratings are tilted in the same direction, ε = 0.005, γ = 0.01).
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    Wenhe Yang, Nan Lin, Xin Wei, Yunyi Chen, Sikun Li, Yuxin Leng, Jianda Shao, "Improving accuracy and sensitivity of diffraction-based overlay metrology," Chin. Opt. Lett. 21, 071204 (2023)

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    Paper Information

    Category: Instrumentation, Measurement, and Optical Sensing

    Received: Feb. 27, 2023

    Accepted: Apr. 18, 2023

    Published Online: Jul. 24, 2023

    The Author Email: Nan Lin (nanlin@siom.ac.cn), Jianda Shao (jdshao@siom.ac.cn)

    DOI:10.3788/COL202321.071204

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