Quantitative Phase Microscopy with High Stability

Kai Wen; Ying Ma; Meiling Zhang; Yu Wang; Chi Fu; Juanjuan Zheng; Lixin Liu; Peng Gao; Baoli Yao

doi:10.3788/LOP57.200001

Laser & Optoelectronics Progress, Volume. 57, Issue 20, 200001(2020)

Quantitative Phase Microscopy with High Stability

Kai Wen¹, Ying Ma¹, Meiling Zhang¹, Yu Wang¹, Chi Fu¹, Juanjuan Zheng¹, Lixin Liu¹, Peng Gao^1、*, and Baoli Yao²

Author Affiliations

¹School of Physics and Optoelectronic Engineering, Xidian University, Xi'an, Shaanxi 710071, China

²State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an, Shaanxi 710119, China

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Kai Wen, Ying Ma, Meiling Zhang, Yu Wang, Chi Fu, Juanjuan Zheng, Lixin Liu, Peng Gao, Baoli Yao. Quantitative Phase Microscopy with High Stability[J]. Laser & Optoelectronics Progress, 2020, 57(20): 200001

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Paper Information

Category: Reviews

Received: Mar. 19, 2020

Accepted: Apr. 20, 2020

Published Online: Oct. 13, 2020

The Author Email: Peng Gao (peng.gao@xidian.edu.cn)

DOI:10.3788/LOP57.200001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology