Acta Optica Sinica, Volume. 43, Issue 19, 1928001(2023)

Experiment and Analysis of Damage of CMOS Image Sensor Induced by Proton Irradiation with Different Bias Conditions

Xu Nie1, Zujun Wang1,2、*, Baichuan Wang2, Yuanyuan Xue2, Gang Huang1, Shankun Lai1, Ning Tang1, Maocheng Wang2, Mingtong Zhao2, Fuyu Yang2, and Zhongming Wang2
Author Affiliations
  • 1School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, Hunan , China
  • 2State Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi'an 710024, Shaanxi , China
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    Xu Nie, Zujun Wang, Baichuan Wang, Yuanyuan Xue, Gang Huang, Shankun Lai, Ning Tang, Maocheng Wang, Mingtong Zhao, Fuyu Yang, Zhongming Wang. Experiment and Analysis of Damage of CMOS Image Sensor Induced by Proton Irradiation with Different Bias Conditions[J]. Acta Optica Sinica, 2023, 43(19): 1928001

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    Paper Information

    Category: Remote Sensing and Sensors

    Received: Feb. 23, 2023

    Accepted: Apr. 17, 2023

    Published Online: Sep. 28, 2023

    The Author Email: Zujun Wang (wzj029@qq.com)

    DOI:10.3788/AOS230592

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