Experiment and Analysis of Damage of CMOS Image Sensor Induced by Proton Irradiation with Different Bias Conditions

Xu Nie; Zujun Wang; Baichuan Wang; Yuanyuan Xue; Gang Huang; Shankun Lai; Ning Tang; Maocheng Wang; Mingtong Zhao; Fuyu Yang; Zhongming Wang

doi:10.3788/AOS230592

Acta Optica Sinica, Volume. 43, Issue 19, 1928001(2023)

Experiment and Analysis of Damage of CMOS Image Sensor Induced by Proton Irradiation with Different Bias Conditions

Xu Nie¹, Zujun Wang^1,2、*, Baichuan Wang², Yuanyuan Xue², Gang Huang¹, Shankun Lai¹, Ning Tang¹, Maocheng Wang², Mingtong Zhao², Fuyu Yang², and Zhongming Wang²

Author Affiliations

¹School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, Hunan , China

²State Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi'an 710024, Shaanxi , China

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Xu Nie, Zujun Wang, Baichuan Wang, Yuanyuan Xue, Gang Huang, Shankun Lai, Ning Tang, Maocheng Wang, Mingtong Zhao, Fuyu Yang, Zhongming Wang. Experiment and Analysis of Damage of CMOS Image Sensor Induced by Proton Irradiation with Different Bias Conditions[J]. Acta Optica Sinica, 2023, 43(19): 1928001

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Paper Information

Category: Remote Sensing and Sensors

Received: Feb. 23, 2023

Accepted: Apr. 17, 2023

Published Online: Sep. 28, 2023

The Author Email: Zujun Wang (wzj029@qq.com)

DOI:10.3788/AOS230592

Topics

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