[1] Jousset P, Reinsch T, Ryberg T et al. Dynamic strain determination using fibre-optic cables allows imaging of seismological and structural features[J]. Nature Communications, 9, 1-11(2018).

[2] Gu N T, Xiao Y W, Huang L H et al. Polarization imaging based on time-integration by a continuous rotating polarizer[J]. Optics Express, 30, 3497-3515(2022).

[3] Liu T C, Lin L P, Bi X X et al. In situ quantification of interphasial chemistry in Li-ion battery[J]. Nature Nanotechnology, 14, 50-56(2019).

[4] Xu Z J, Dong Y, Tseng C K et al. CMOS-compatible all-Si metasurface polarizing bandpass filters on 12-inch wafers[J]. Optics Express, 27, 26060-26069(2019).

[5] Zheng S Q, Lin Q G, Cai Y et al. Improved common-path spectral interferometer for single-shot terahertz detection[J]. Photonics Research, 6, 177-181(2018).

[6] Tang F C, Bu Y, Wu F et al. Parameter measurement of wave plate based on radially polarized beams[J]. Chinese Journal of Lasers, 49, 1704006(2022).

[7] Liu W X, Liu M, Zhang S L. Method for the measurement of phase retardation of any wave plate with high precision[J]. Applied Optics, 47, 5562-5569(2008).

[8] Chen K H, Lin C H, Liu P C. An interferometric method for simultaneously determination the phase retardation and fast-axis azimuth angle of a wave plate[J]. Journal of Modern Optics, 67, 992-997(2020).

[9] Chen Q H, Guan Y, Zhou S et al. High-accuracy wave plate measurement based on dual-frequency laser interferometry and phase detection[J]. Acta Optica Sinica, 43, 0112002(2023).

[10] Zeng A J, Li F Y, Zhu L L et al. Simultaneous measurement of retardance and fast axis angle of a quarter-wave plate using one photoelastic modulator[J]. Applied Optics, 50, 4347-4352(2011).

[11] Williams P A, Rose A H, Wang C M. Rotating-polarizer polarimeter for accurate retardance measurement[J]. Applied Optics, 36, 6466-6472(1997).

[12] Gu H G, Chen X G, Shi Y T et al. Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry[J]. Optics Express, 26, 25408-25425(2018).

[13] Gu H G, Chen X G, Zhang C W et al. Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer[J]. Journal of Optics, 20, 015401(2018).

[14] Berreman D W. Optics in stratified and anisotropic media: 4×4-matrix formulation[J]. Journal of the Optical Society of America, 62, 502-510(1972).

[15] Schubert M. Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems[J]. Physical Review B, 53, 4265-4274(1996).

[16] Grundmann M, Sturm C, Kranert C et al. Optically anisotropic media: new approaches to the dielectric function, singular axes, microcavity modes and Raman scattering intensities[J]. Physica Status Solidi (RRL) Rapid Research Letters, 11, 1600295(2017).

[17] Fujiwara H[M]. Spectroscopic ellipsometry: principles and applications(2007).

[18] Azzam R M A, Bashara N M, Ballard S S. Ellipsometry and polarized light[J]. Physics Today, 31, 72(1978).

[19] Jellison G E,. Spectroscopic ellipsometry data analysis: measured versus calculated quantities[J]. Thin Solid Films, 313/314, 33-39(1998).

[20] Zhang S, Jiang H, Gu H G et al. High-speed Mueller matrix ellipsometer with microsecond temporal resolution[J]. Optics Express, 28, 10873-10887(2020).

[21] Arwin H, Berlind T, Johs B et al. Cuticle structure of the scarab beetle Cetonia aurata analyzed by regression analysis of Mueller-matrix ellipsometric data[J]. Optics Express, 21, 22645-22656(2013).

[22] Ge B L, Larson S, Tu H T et al. Generalized ellipsometry characterization of Ag nanorod arrays prepared by oblique angle deposition[J]. Nanotechnology, 31, 075705(2020).

[23] Shan Y, Liu P, Chen Y et al. Microstructure-induced anisotropic optical properties of YF3 columnar thin films prepared by glancing angle deposition[J]. Nanomaterials, 10, 2413(2020).

[24] Losurdo M, Hingerl K[M]. Ellipsometry at the nanoscale(2013).

[25] Li J, Ramanujam B, Collins R W. Dual rotating compensator ellipsometry: theory and simulations[J]. Thin Solid Films, 519, 2725-2729(2011).

[26] Fan Z T. Research on the advanced parameters problem of Mueller matrix ellipsometry system[D], 13-17(2019).

[27] Hilfiker J N, Hong N N, Schoeche S. Mueller matrix spectroscopic ellipsometry[J]. Advanced Optical Technologies, 11, 59-91(2022).

[28] Chen X G, Gu H G, Liu J M et al. Advanced Mueller matrix ellipsometry: instrumentation and emerging applications[J]. Science China Technological Sciences, 65, 2007-2030(2022).

[29] Zheng Z, Hou J F. Design, calibration, and measurement of single wavelength mid-infrared Mueller matrix ellipsometer[J]. Acta Optica Sinica, 42, 1812004(2022).