Fig. 1. Crystal coordinate system, measurement coordinate system and Euler angles

Fig. 2. Schematic diagram of measuring system

Fig. 3. Phase retardation dispersion curves fitted with built-in model for different azimuthal angles

Fig. 4. Measurement and fitting results of thick sample. (a) Dispersion curves of actually measured Mueller matrix elements; (b) dispersion curves of Mueller matrix elements fitted by Mueller matrix model; (c) difference curves between actually measured values and model fitted values

Fig. 5. RMSE values of two samples at different azimuthal angles and incident angles