Characteristic Analysis of 975 nm Tapered Semiconductor Lasers with Separated Contacts

Yuxuan Man; Li Zhong; Xiaoyu Ma; Suping Liu; Yuxi Ni

doi:10.3788/CJL202148.1701005

Chinese Journal of Lasers, Volume. 48, Issue 17, 1701005(2021)

Characteristic Analysis of 975 nm Tapered Semiconductor Lasers with Separated Contacts

Yuxuan Man^1,3, Li Zhong^1、*, Xiaoyu Ma^1,2, Suping Liu¹, and Yuxi Ni¹

¹National Engineering Research Center for Optoelectronic Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China

²College of Materials Science and Optoelectronics, University of Chinese Academy of Sciences, Beijing 100049, China

³School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

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Yuxuan Man, Li Zhong, Xiaoyu Ma, Suping Liu, Yuxi Ni. Characteristic Analysis of 975 nm Tapered Semiconductor Lasers with Separated Contacts[J]. Chinese Journal of Lasers, 2021, 48(17): 1701005

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Paper Information

Category: laser devices and laser physics

Received: Feb. 2, 2021

Accepted: Mar. 9, 2021

Published Online: Sep. 1, 2021

The Author Email: Li Zhong (zhongli@semi.ac.cn)

DOI:10.3788/CJL202148.1701005

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology