Acta Optica Sinica, Volume. 39, Issue 9, 0916001(2019)

Surface Morphologies of InAs/GaSb Type II Superlattice Materials Obtained via Growth Interruption Method

Chenglin Li, Dan Fang*, Jian Zhang, Jiaxu Gao, Xuan Fang, Dengkui Wang, and Jilong Tang
Author Affiliations
  • State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, Changchun, Jilin 130022, China
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    References(11)

    [2] Pu J C, Chen H J, Guo J et al. Growth and charaterization of InAs/GaSb superlattices photoconductors[J]. Acta Photonica Sinica, 37, 16-18(2008).

    [3] Ploog K. Molecular beam epitaxy of III-V compounds[M]. ∥Freyhardt H C. III-V semiconductors. Berlin, Heidelberg: Springer, 73-162(1980).

    [10] Wang G W, Niu Z C, Xu Y Q et al[J]. MBE growth of InAs/GaSb superlattices for long-wavelength infrared detection Aero Weaponry, 2013, 33-37.

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    Chenglin Li, Dan Fang, Jian Zhang, Jiaxu Gao, Xuan Fang, Dengkui Wang, Jilong Tang. Surface Morphologies of InAs/GaSb Type II Superlattice Materials Obtained via Growth Interruption Method[J]. Acta Optica Sinica, 2019, 39(9): 0916001

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    Paper Information

    Category: Materials

    Received: Mar. 29, 2019

    Accepted: May. 13, 2019

    Published Online: Sep. 9, 2019

    The Author Email: Fang Dan (fangdan19822011@163.com)

    DOI:10.3788/AOS201939.0916001

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