Laser & Optoelectronics Progress, Volume. 62, Issue 6, 0612008(2025)

Lightweight Insulator Defect Detection Based on Multiscale Feature Fusion

Tieqiang Sun1,2、*, Zhaozhi Hong1, Chao Song1,2, and Pengcheng Xiao3
Author Affiliations
  • 1College of Artificial Intelligence, North China University of Science and Technology, Tangshan 063210, Hebei , China
  • 2Hebei Key Laboratory of Industrial Intelligent Perception, North China University of Science and Technology, Tangshan 063210, Hebei , China
  • 3College of Metallurgy and Energy, North China University of Science and Technology, Tangshan 063210, Hebei , China
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    References(30)

    [1] Liu K P, Li B Q, Qin L et al. Review on the application of deep learning target detection algorithm in insulator defect detection of overhead transmission lines[J]. High Voltage Engineering, 49, 3584-3595(2023).

    [2] Huang F Z, Wang T C. Insulator defect detection based on lightweight GCP-YOLOv8s[J]. Laser & Optoelectronics Progress, 62, 0212004(2025).

    [6] Zhai Y J, Wang L Y, Guo C B. Insulator object detection in complex background based on Faster R-CNN[J]. Electronic Measurement Technology, 46, 187-194(2023).

    [7] Sun Z F, Yu J H, Zhu X F et al. Dental-disease-recognition algorithm of panoramic oral radiograph based on improved YOLOv5s[J]. Chinese Journal of Lasers, 51, 1507106(2024).

    [8] Li R H, Yang Y, Li N et al. Transmission line pin detection based on improved SSD[C](2022).

    [9] Jia X F, Wu X R, Zhao B T. Lightweight detection network for insulator self-detonation defect DE-YOLO[J]. Journal of Electronic Measurement and Instrumentation, 37, 28-35(2023).

    [11] Zhai Y J, Zhao X Y, Wang L Y et al. IDD-YOLOv7: a lightweight method for multiple defect detection of insulators in transmission lines[J]. Journal of Graphics, 45, 90-101(2024).

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    Tieqiang Sun, Zhaozhi Hong, Chao Song, Pengcheng Xiao. Lightweight Insulator Defect Detection Based on Multiscale Feature Fusion[J]. Laser & Optoelectronics Progress, 2025, 62(6): 0612008

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 19, 2024

    Accepted: Sep. 10, 2024

    Published Online: Mar. 5, 2025

    The Author Email:

    DOI:10.3788/LOP241864

    CSTR:32186.14.LOP241864

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