Laser & Optoelectronics Progress, Volume. 62, Issue 6, 0612008(2025)
Lightweight Insulator Defect Detection Based on Multiscale Feature Fusion
Fig. 4. Structure diagrams of MobileNet Block and RepViT Block. (a) MobileNet Block; (b) RepViT Block
Fig. 13. Thermal map of C2f before and after improvement. (a) Defect labels; (b) C2f; (c) C2f-RE
Fig. 14. Contrast curves of PmA and recall before and after improvement. (a) PmA; (b) recall
Fig. 15. Comparison of defect detection results. (a) Self-explode and flashover; (b) worn; (c) flashover
|
|
|
|
|
Get Citation
Copy Citation Text
Tieqiang Sun, Zhaozhi Hong, Chao Song, Pengcheng Xiao. Lightweight Insulator Defect Detection Based on Multiscale Feature Fusion[J]. Laser & Optoelectronics Progress, 2025, 62(6): 0612008
Category: Instrumentation, Measurement and Metrology
Received: Aug. 19, 2024
Accepted: Sep. 10, 2024
Published Online: Mar. 5, 2025
The Author Email:
CSTR:32186.14.LOP241864