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Laser & Optoelectronics Progress, Volume. 62, Issue 6, 0612008(2025)

Lightweight Insulator Defect Detection Based on Multiscale Feature Fusion

Tieqiang Sun1,2、*, Zhaozhi Hong1, Chao Song1,2, and Pengcheng Xiao3
Author Affiliations
  • 1College of Artificial Intelligence, North China University of Science and Technology, Tangshan 063210, Hebei , China
  • 2Hebei Key Laboratory of Industrial Intelligent Perception, North China University of Science and Technology, Tangshan 063210, Hebei , China
  • 3College of Metallurgy and Energy, North China University of Science and Technology, Tangshan 063210, Hebei , China
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    Article index updated: Sep. 12, 2025

    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
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    Tieqiang Sun, Zhaozhi Hong, Chao Song, Pengcheng Xiao. Lightweight Insulator Defect Detection Based on Multiscale Feature Fusion[J]. Laser & Optoelectronics Progress, 2025, 62(6): 0612008

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 19, 2024

    Accepted: Sep. 10, 2024

    Published Online: Mar. 5, 2025

    The Author Email:

    DOI:10.3788/LOP241864

    CSTR:32186.14.LOP241864

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology