Photonics Research, Volume. 12, Issue 12, 2757(2024)
Illumination diversity in multiwavelength extreme ultraviolet ptychography
Fig. 1. Spectral diversity in diffraction. (a), (b) A binary object is illuminated by a beam containing the 27th and 29th harmonics (at 38.4 and 35.7 nm wavelength), either (a) with a flat intensity and phase or (b) with order-dependent OAM. (c), (d) Difference of the monochromatic diffraction patterns between the two wavelengths (
Fig. 2. Scanning diversity and reconstruction quality of simulated data sets. (a) Logarithmic scale diffraction patterns are shown for beams with radii of curvature
Fig. 3. Experimental setup. (a) The driving NIR laser is focused by an
Fig. 4. Reconstruction results from ptychographic measurements for (a) Gaussian, (b) vortex, and (c) structured probes. Right: amplitude of reconstructed objects. Top left: zoomed-in areas of the object. Bottom left: dominant modes of the reconstructed probes of the five brightest harmonics. Scale bars in all figures correspond to 20 μm.
Fig. 5. Reconstruction results from synthetic ptychographic datasets with (a)–(d) Gaussian, (e)–(h) vortex, and (i)–(l) structured probes. (a), (e), (i) Amplitude of the reconstructed object. (b), (f), (j) Zoomed-in area of the object group 9/elements 5 and 6. (c), (g), (k) Probe reconstructions of the five brightest harmonics. (d), (h), (l) FRC computed by comparing object reconstructions with true object. Scale bars in all figures correspond to 20 μm.
Fig. 6. Diversity metrics for different probe beam structures. (a) Scanning diversity of polychromatic diffraction patterns. (b) Spectral diversity between diffraction patterns at wavelengths of 35.6 and 38.3 nm. (c) Spectral diversity between diffraction patterns at wavelengths of 38.3 and 41.4 nm. The solid lines indicate the mean values of comparing adjacent scan positions (for scanning diversity) or wavelengths (for spectral diversity) over the whole diffraction patterns series, while the shaded areas have a width of one standard deviation.
Fig. 7. Fisher information for different probe beam structures. The shape of the violin plots describes the distribution of Fisher information per diffraction pattern (for a total of 219 scanning positions). The Fisher information is normalized by the average information achievable with a Gaussian probe. (a) Fisher information associated with a parameter
Fig. 8. Complementary object and probe reconstructions for experimental data. (a)–(c) Complex-valued representations of the reconstructed object for (a) Gaussian, (b) vortex, and (c) structured beams. (d)–(e) Amplitude of the partially coherent 27th harmonic (38.3 nm) beams at the object plane. (g)–(i) Amplitude and complex-valued plots of the incoherent modes of the 27th harmonic. In all complex-valued plots, brightness corresponds to amplitude and hue to phase. Scale bars in all figures are equal to 20 μm.
Fig. 9. Scanning diversity metrics for different normalization strategies. (a) Global normalization, (b) local normalization, and (c) local normalization on total flux. The solid lines indicate the mean values of comparing adjacent scan positions for scanning diversity over the whole diffraction patterns series, while the shaded areas have a width of one standard deviation. Note the different horizontal and vertical scales.
Fig. 10. Spectral diversity metrics for monochromatic diffraction patterns at 38.3 and 41.4 nm for different normalization strategies. (a) Global normalization, (b) local normalization, (c) local normalization including spectral weights, and (d) local normalization on total flux. The solid lines indicate the mean values of comparing wavelengths over the whole diffraction patterns series, while the shaded areas have a width of one standard deviation. Note the different horizontal and vertical scales.
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Antonios Pelekanidis, Fengling Zhang, Matthias Gouder, Jacob Seifert, Mengqi Du, Kjeld S. E. Eikema, Stefan Witte, "Illumination diversity in multiwavelength extreme ultraviolet ptychography," Photonics Res. 12, 2757 (2024)
Category: Imaging Systems, Microscopy, and Displays
Received: Jun. 27, 2024
Accepted: Sep. 10, 2024
Published Online: Nov. 12, 2024
The Author Email: Stefan Witte (witte@arcnl.nl)
CSTR:32188.14.PRJ.533983