Chinese Journal of Lasers, Volume. 41, Issue 9, 902007(2014)

A Detecting System of Sapphire Internal Defects Based on Laser Light Scattering Tomography

Liu Yang1、*, Xu Wendong1, Zhao Chengqiang1, Hu Yonglu1, Liu Tao1, and Wang Chuang2
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    CLP Journals

    [1] Bian Xiaowei, Chen Meng, Li Gang. Study on Machining of Sapphire by 355 nm Nanosecond and 1064 nm Picosecond Laser[J]. Laser & Optoelectronics Progress, 2016, 53(5): 51404

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    Liu Yang, Xu Wendong, Zhao Chengqiang, Hu Yonglu, Liu Tao, Wang Chuang. A Detecting System of Sapphire Internal Defects Based on Laser Light Scattering Tomography[J]. Chinese Journal of Lasers, 2014, 41(9): 902007

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    Paper Information

    Category: Laser physics

    Received: Mar. 26, 2014

    Accepted: --

    Published Online: Jul. 22, 2014

    The Author Email: Yang Liu (visionly@foxmail.com)

    DOI:10.3788/cjl201441.0902007

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