Chinese Journal of Lasers, Volume. 41, Issue 9, 902007(2014)
A Detecting System of Sapphire Internal Defects Based on Laser Light Scattering Tomography
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Liu Yang, Xu Wendong, Zhao Chengqiang, Hu Yonglu, Liu Tao, Wang Chuang. A Detecting System of Sapphire Internal Defects Based on Laser Light Scattering Tomography[J]. Chinese Journal of Lasers, 2014, 41(9): 902007
Paper Information
Category: Laser physics
Received: Mar. 26, 2014
Accepted: --
Published Online: Jul. 22, 2014
The Author Email: Yang Liu (visionly@foxmail.com)
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