Accuracy in Refractive Index Measurement of As<sub>2</sub>Se<sub>3</sub> Chalcogenide Glass by IR Spectroscopic Ellipsometer

Yang Li; Yongxing Liu; Shixun Dai; Tiefeng Xu; Changgui Lin; Feifei Chen

doi:10.3788/AOS201838.0612002

Acta Optica Sinica, Volume. 38, Issue 6, 0612002(2018)

Accuracy in Refractive Index Measurement of As₂Se₃ Chalcogenide Glass by IR Spectroscopic Ellipsometer

Yang Li^1,2, Yongxing Liu^1,2, Shixun Dai^1,2, Tiefeng Xu^1,2、*, Changgui Lin^1,2, and Feifei Chen^1,2

¹ Laboratory of Infrared Materials and Devices, Research Institute of Advanced Technologies, Ningbo University, Ningbo, Zhejiang 315211, China

² Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo, Zhejiang 310027, China

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Yang Li, Yongxing Liu, Shixun Dai, Tiefeng Xu, Changgui Lin, Feifei Chen. Accuracy in Refractive Index Measurement of As₂Se₃ Chalcogenide Glass by IR Spectroscopic Ellipsometer[J]. Acta Optica Sinica, 2018, 38(6): 0612002

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Oct. 20, 2017

Accepted: --

Published Online: Jul. 9, 2018

The Author Email: Xu Tiefeng (xutiefeng@nbu.edu.cn)

DOI:10.3788/AOS201838.0612002

Topics

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Instrumentation, Measurement and Metrology