Journal of Terahertz Science and Electronic Information Technology , Volume. 23, Issue 5, 482(2025)

Sensitive data leakage risk prediction driven by data explicit and implicit relationships

LIANG Hua1, JIN Min2, YAN Hua1, HAN Shihai1, and LI Wei2
Author Affiliations
  • 1Electric Power Research Institute, Chongqing 401123, China, State Grid Chongqing Electric Power Company
  • 2Digitization Department, Chongqing 400014, China, State Grid Chongqing Electric Power Company
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    LIANG Hua, JIN Min, YAN Hua, HAN Shihai, LI Wei. Sensitive data leakage risk prediction driven by data explicit and implicit relationships[J]. Journal of Terahertz Science and Electronic Information Technology , 2025, 23(5): 482

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    Paper Information

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    Received: Aug. 16, 2024

    Accepted: Jun. 5, 2025

    Published Online: Jun. 5, 2025

    The Author Email:

    DOI:10.11805/tkyda2024383

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