Sensitive data leakage risk prediction driven by data explicit and implicit relationships

LIANG Hua; JIN Min; YAN Hua; HAN Shihai; LI Wei

doi:10.11805/tkyda2024383

Journal of Terahertz Science and Electronic Information Technology , Volume. 23, Issue 5, 482(2025)

Sensitive data leakage risk prediction driven by data explicit and implicit relationships

LIANG Hua¹, JIN Min², YAN Hua¹, HAN Shihai¹, and LI Wei²

Author Affiliations

¹Electric Power Research Institute, Chongqing 401123, China, State Grid Chongqing Electric Power Company

²Digitization Department, Chongqing 400014, China, State Grid Chongqing Electric Power Company

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LIANG Hua, JIN Min, YAN Hua, HAN Shihai, LI Wei. Sensitive data leakage risk prediction driven by data explicit and implicit relationships[J]. Journal of Terahertz Science and Electronic Information Technology , 2025, 23(5): 482

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Paper Information

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Received: Aug. 16, 2024

Accepted: Jun. 5, 2025

Published Online: Jun. 5, 2025

The Author Email:

DOI:10.11805/tkyda2024383

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology