Chinese Optics, Volume. 16, Issue 5, 1149(2023)

Relationship between the preparation process of the graphene/silicon hetero-junction photodetector and its voltage-current characteristics

Ya-xian YANG and Guo-qing ZHANG*
Author Affiliations
  • School of Science, Xi'an Polytechnic University, Xi'an 710048, China
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    Figures & Tables(9)
    Structural diagram of Gr/Si hetero-junction photodetector
    Flow chart of Gr/ Si hetero-junction photodetector preparation
    The Raman spectrum of the Gr transfered to a patterned Si substrate surface
    The metallographic micrograph of the Gr/Si hetero-junction after selective etching annealing (graphene boundary along the red dotted circles)
    Comparison of the reverse voltage-current characteristic of large area Gr/Si hetero-junction at different drying temperatures ( before selective etching under dark condition)
    (a) Comparison of the reverse voltage-current characteristics of Gr/Si hetero-junction under different drying temperatures, etching and annealing processes; (b) comparison of the voltage-resistance characteristics of Gr/Si hetero-junction under different drying temperatures, etching and annealing processes( under dark condition )
    Metallographic micrograph of the surface of the hetero-junction after selective etching and annealing (left: after etching, right: after annealing. Red circles are relative obvious volatile impurities or possible residual PMMA glue)
    Reverse voltage-current characteristics and gain curves of Gr/ Si hetero-junction after selective etching and annealing
    (a) The SNR of the Gr/Si hetero-junction at different bias voltages. (b) The responsivity of the Gr/Si hetero-junction at different bias voltages
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    Ya-xian YANG, Guo-qing ZHANG. Relationship between the preparation process of the graphene/silicon hetero-junction photodetector and its voltage-current characteristics[J]. Chinese Optics, 2023, 16(5): 1149

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    Paper Information

    Category: Original Article

    Received: Dec. 30, 2022

    Accepted: Mar. 21, 2023

    Published Online: Oct. 27, 2023

    The Author Email:

    DOI:10.37188/CO.2022-0259

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