Fig. 1. Schematic diagram of femtosecond laser-induced periodic surface structure processing system

Fig. 2. SEM images of the irradiated region of the silicon at different pulses at a laser fluence of 0.28 J/cm², where the double arrow shows the laser polarization direction

Fig. 3. Surface morphology and scale change under different characterization methods at a laser fluence of 0.28 J/cm². (a) SEM image;(b) laser confocal microscopy image;(c) surface structure scale change

Fig. 4. SEM images of the irradiated region of the silicon at different laser fluences

Fig. 5. Range of laser processing parameters for the formation of grid-like periodic surface structure

Fig. 6. SEM images of “split” fringes at different laser fluences

Fig. 7. Schematic diagrams of femtosecond laser performing linear scanning and structural color measurement on the surface of a target. (a) Linear scanning; (b) scanning path; (c) schematic diagram of a structural color measurement system

Fig. 8. Color rendering of the surface of the target at different viewing angles ( HEB: horizontal polarization; UST: vertical polarization)