Opto-Electronic Engineering, Volume. 48, Issue 1, 200112(2021)
Crack detection based on multi-scale Faster RCNN with attention
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Chen Haiyong, Zhao Peng, Yan Haowei. Crack detection based on multi-scale Faster RCNN with attention[J]. Opto-Electronic Engineering, 2021, 48(1): 200112
Received: Apr. 2, 2020
Accepted: --
Published Online: Sep. 2, 2021
The Author Email: Haiyong Chen (haiyong.chen@hebut.edu.cn)