Opto-Electronic Engineering, Volume. 48, Issue 1, 200112(2021)

Crack detection based on multi-scale Faster RCNN with attention

Chen Haiyong1、*, Zhao Peng1, and Yan Haowei2
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    Chen Haiyong, Zhao Peng, Yan Haowei. Crack detection based on multi-scale Faster RCNN with attention[J]. Opto-Electronic Engineering, 2021, 48(1): 200112

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    Paper Information

    Received: Apr. 2, 2020

    Accepted: --

    Published Online: Sep. 2, 2021

    The Author Email: Haiyong Chen (haiyong.chen@hebut.edu.cn)

    DOI:10.12086/oee.2021.200112

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