Chinese Optics, Volume. 15, Issue 4, 703(2022)
Through-focus scanning optical microscopy measurement based on machine learning
Fig. 2. (a) TSOM experimental setup; TSOM pseudo color images with widths of (b) 2 μm, (c) 10 μm, and (d) 30 μm. The lateral axis represents pixels and the vertical axis represents through-focus positions
Fig. 7. Prediction results of MEMS groove with different widths and depths based on SVR
Fig. 8. Evaluation indicators of prediction performance of the model
Fig. 9. Prediction results of single point repeatability of the mode
|
Get Citation
Copy Citation Text
Guan-nan LI, Jun-kai SHI, Xiao-mei CHEN, Chao GAO, Xing-jian JIANG, Cheng-jun CUI, Qiang ZHU, Shu-chun HUO, Wei-hu ZHOU. Through-focus scanning optical microscopy measurement based on machine learning[J]. Chinese Optics, 2022, 15(4): 703
Category: Original Article
Received: Jan. 10, 2022
Accepted: --
Published Online: Sep. 6, 2022
The Author Email: