Chinese Optics, Volume. 15, Issue 4, 703(2022)

Through-focus scanning optical microscopy measurement based on machine learning

Guan-nan LI1, Jun-kai SHI1、*, Xiao-mei CHEN1, Chao GAO1,2, Xing-jian JIANG1, Cheng-jun CUI1, Qiang ZHU1,2,3, Shu-chun HUO1, and Wei-hu ZHOU1,2
Author Affiliations
  • 1Institute of Microelectronics of the Chinese Academy of Sciences, Optoelectronic R & D Center, Beijing 100094, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3China Banknote Printing Technology Research Institute Co., LTD., Beijing 100070, China
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    Figures & Tables(10)
    Schematic diagram of the TSOM process
    (a) TSOM experimental setup; TSOM pseudo color images with widths of (b) 2 μm, (c) 10 μm, and (d) 30 μm. The lateral axis represents pixels and the vertical axis represents through-focus positions
    MEMS widths prediction flowchart based on HOG-SVR
    HOG feature extraction
    Schematic diagram of SVR
    Processes of dataset acquirement
    Prediction results of MEMS groove with different widths and depths based on SVR
    Evaluation indicators of prediction performance of the model
    Prediction results of single point repeatability of the mode
    • Table 1. Sample parameters

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      Table 1. Sample parameters

      样品编号设计槽宽/μm槽深/μm深宽比电镜实测槽宽/μm
      122412∶12.21/2.52/2.61/2.86/3.06
      22200100∶11.79/1.98/2.19/2.58
      310343.4∶110.5/10.7/10.8/11.1/11.3
      41010610.6∶110.8/11/11.3/11.7
      530381.3∶130.6/30.9/31/31.2/31.5
      6302367.9∶131.4/31.8/32.1/33.1
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    Guan-nan LI, Jun-kai SHI, Xiao-mei CHEN, Chao GAO, Xing-jian JIANG, Cheng-jun CUI, Qiang ZHU, Shu-chun HUO, Wei-hu ZHOU. Through-focus scanning optical microscopy measurement based on machine learning[J]. Chinese Optics, 2022, 15(4): 703

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    Paper Information

    Category: Original Article

    Received: Jan. 10, 2022

    Accepted: --

    Published Online: Sep. 6, 2022

    The Author Email:

    DOI:10.37188/CO.2022-0009

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