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Chinese Optics Letters, Volume. 15, Issue 6, 062401(2017)

Optical rectification and Pockels effect as a method to detect the properties of Si surfaces

Qi Wang1, Li Zhang1, Xin Wang1, Haiyan Quan1, Zhanguo Chen1、*, Jihong Zhao1, Xiuhuan Liu2, Lixin Hou3, Yanjun Gao1, Gang Jia1, and Shaowu Chen4
Author Affiliations
  • 1State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
  • 2College of Communication Engineering, Jilin University, Changchun 130012, China
  • 3College of Information Technology, Jilin Agricultural University, Changchun 130118, China
  • 4State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
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    CLP Journals

    [1] Li Zhang, Fangye Li, Shuai Wang, Qi Wang, Kairan Luan, Xi Chen, Xiuhuan Liu, Lingying Qiu, Zhanguo Chen, Jihong Zhao, Lixin Hou, Yanjun Gao, Gang Jia, "Optical rectification in surface layers of germanium," Chin. Opt. Lett. 16, 102401 (2018)

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    Qi Wang, Li Zhang, Xin Wang, Haiyan Quan, Zhanguo Chen, Jihong Zhao, Xiuhuan Liu, Lixin Hou, Yanjun Gao, Gang Jia, Shaowu Chen, "Optical rectification and Pockels effect as a method to detect the properties of Si surfaces," Chin. Opt. Lett. 15, 062401 (2017)

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    Paper Information

    Category: Optics at Surfaces

    Received: Dec. 7, 2016

    Accepted: Feb. 24, 2017

    Published Online: Jul. 20, 2018

    The Author Email: Zhanguo Chen (czg@jlu.edu.cn)

    DOI:10.3788/COL201715.062401

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology