Optical rectification and Pockels effect as a method to detect the properties of Si surfaces

Qi Wang; Li Zhang; Xin Wang; Haiyan Quan; Zhanguo Chen; Jihong Zhao; Xiuhuan Liu; Lixin Hou; Yanjun Gao; Gang Jia; Shaowu Chen

doi:10.3788/COL201715.062401

Chinese Optics Letters, Volume. 15, Issue 6, 062401(2017)

Optical rectification and Pockels effect as a method to detect the properties of Si surfaces

Qi Wang¹, Li Zhang¹, Xin Wang¹, Haiyan Quan¹, Zhanguo Chen^1、*, Jihong Zhao¹, Xiuhuan Liu², Lixin Hou³, Yanjun Gao¹, Gang Jia¹, and Shaowu Chen⁴

Author Affiliations

¹State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China

²College of Communication Engineering, Jilin University, Changchun 130012, China

³College of Information Technology, Jilin Agricultural University, Changchun 130118, China

⁴State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China

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Qi Wang, Li Zhang, Xin Wang, Haiyan Quan, Zhanguo Chen, Jihong Zhao, Xiuhuan Liu, Lixin Hou, Yanjun Gao, Gang Jia, Shaowu Chen, "Optical rectification and Pockels effect as a method to detect the properties of Si surfaces," Chin. Opt. Lett. 15, 062401 (2017)

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Paper Information

Category: Optics at Surfaces

Received: Dec. 7, 2016

Accepted: Feb. 24, 2017

Published Online: Jul. 20, 2018

The Author Email: Zhanguo Chen (czg@jlu.edu.cn)

DOI:10.3788/COL201715.062401

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology