Chinese Journal of Lasers, Volume. 47, Issue 8, 802002(2020)

Effect of Crystal Orientation on Synthesis of Graphene Layers by Laser Decomposition of 4H-SiC

Sun Zhengyang1,2, Ji Lingfei1,2、*, Lin Zhenyuan1,2, Zhang Tong1,2, Xu Yuanbo1,2, and Zhang Litian1,2
Author Affiliations
  • 1Institute of Laser Engineering, Faculty of Materials and Manufacturing, Beijing University of Technology,Beijing 100124, China
  • 2Key Laboratory of Trans-Scale Laser Manufacturing Technology of Ministry of Education, Beijing 100124, China
  • show less
    Figures & Tables(9)
    Schematic of experimental device
    Raman spectra and spectral peak intensity ratios of 4H-SiC sample surface irradiated by different numbers of laser pulses
    Raman spectra of 4H-SiC sample surface irradiated by laser with different energy densities
    AFM morphology of Si-plane (0001) and a-plane (11?20) of SiC sample surface after 8000 pulses of laser irradiation with different energy densities. (a) Si-plane (0001), 1.0 J/cm2; (b) Si-plane (0001), 1.06 J/cm2; (c) Si-plane (0001), 1.13 J/cm2; (d) Si-plane (0001), 1.19 J/cm2; (e) a-plane (11?20), 1.0 J/cm2; (f) a-plane (11?20), 1.06 J/cm2; (g) a-plane (11?20), 1.13 J/cm2; (h) a-plane (11?20), 1.19 J/cm2
    4H-SiC supercell model and schematics of arrangement of different crystal plane atoms. (a) Supercell ball bat model; (b) Si-plane (0001) atom arrangement diagram; (c) a-plane (11?20) atom arrangement diagram
    Schematics of graphene growth after laser irradiating 4H-SiC sample. (a) Irradiating Si-plane (0001); (b) irradiating a-plane(11 20)
    High resolution transmission electron microscope (HRTEM) images of 4H-SiC after after laser irradiation (a) Irradiating Si-plane (0001) of SiC sample and the illustration is selected area enlarged view; (b) irradiating a-plane (0001) of SiC sample and the illustration is selected area enlarged view
    • Table 1. Hall effect measurement for sample surface after Si-plane (0001) is irradiated by laser with different energy densities (number of pulse is 8000)

      View table

      Table 1. Hall effect measurement for sample surface after Si-plane (0001) is irradiated by laser with different energy densities (number of pulse is 8000)

      Energy density /(J·cm-2)Resistivity /(Ω·cm-1)Surface carrier mobility /(cm2·V-1·s-1)Surface currentconcentration (n type)
      1.011.045.789.789×1016
      1.060.52341696.881×1016
      1.130.83041057.422×1016
      1.192.08421.91.368×1017
    • Table 2. Hall effect measurement for sample surface after a-plane (11?20) is irradiated by laser with different energy densities (number of pulse is 8000)

      View table

      Table 2. Hall effect measurement for sample surface after a-plane (11?20) is irradiated by laser with different energy densities (number of pulse is 8000)

      Energy density /(J·cm-2)Resistivity /(Ω·cm-1)Surface carrier mobility /(cm2·V-1·s-1)Surface currentconcentration (n type)
      1.00.32411451.326×1017
      1.060.33293086.281×1016
      1.130.3241071.8×1017
      1.190.337363.72.695×1017
    Tools

    Get Citation

    Copy Citation Text

    Sun Zhengyang, Ji Lingfei, Lin Zhenyuan, Zhang Tong, Xu Yuanbo, Zhang Litian. Effect of Crystal Orientation on Synthesis of Graphene Layers by Laser Decomposition of 4H-SiC[J]. Chinese Journal of Lasers, 2020, 47(8): 802002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: laser manufacturing

    Received: Jan. 6, 2020

    Accepted: --

    Published Online: Aug. 24, 2020

    The Author Email: Lingfei Ji (ncltji@bjut.edu.cn)

    DOI:10.3788/CJL202047.0802002

    Topics