Acta Optica Sinica, Volume. 40, Issue 18, 1812002(2020)

Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives

Minyang Wu1, Yinhang Ma1, Hao Cheng2, and Fujun Yang1、*
Author Affiliations
  • 1Jiangsu Key Laboratory of Engineering Mechanics, Southeast University, Nanjing, Jiangsu 211189, China
  • 2Science and Technology on Reliability and Environment Engineering Laboratory, Beijing Institute of Structure and Environment Engineering, Beijing 100076, China
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    Minyang Wu, Yinhang Ma, Hao Cheng, Fujun Yang. Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives[J]. Acta Optica Sinica, 2020, 40(18): 1812002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: May. 14, 2020

    Accepted: Jun. 9, 2020

    Published Online: Aug. 31, 2020

    The Author Email: Yang Fujun (yang-fj@seu.edu.cn)

    DOI:10.3788/AOS202040.1812002

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