Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives

Minyang Wu; Yinhang Ma; Hao Cheng; Fujun Yang

doi:10.3788/AOS202040.1812002

Acta Optica Sinica, Volume. 40, Issue 18, 1812002(2020)

Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives

Minyang Wu¹, Yinhang Ma¹, Hao Cheng², and Fujun Yang^1、*

Author Affiliations

¹Jiangsu Key Laboratory of Engineering Mechanics, Southeast University, Nanjing, Jiangsu 211189, China

²Science and Technology on Reliability and Environment Engineering Laboratory, Beijing Institute of Structure and Environment Engineering, Beijing 100076, China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Mar. 10, 2025

The article is cited by 3 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Minyang Wu, Yinhang Ma, Hao Cheng, Fujun Yang. Color-Camera-Based Dual-Wavelength Shearography for Simultaneously Measuring in-Plane and out-of-Plane Displacement Derivatives[J]. Acta Optica Sinica, 2020, 40(18): 1812002

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Instrumentation, Measurement and Metrology

Received: May. 14, 2020

Accepted: Jun. 9, 2020

Published Online: Aug. 31, 2020

The Author Email: Yang Fujun (yang-fj@seu.edu.cn)

DOI:10.3788/AOS202040.1812002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology