Acta Optica Sinica, Volume. 33, Issue 10, 1009001(2013)
Surface Profile Measurement of Microstructures Based on Dual-Wavelength Digital Microscopic Image-Plane Holography
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Zeng Yanan, Wang Fei, Lei Hai, Hu Xiaodong, Hu Xiaotang. Surface Profile Measurement of Microstructures Based on Dual-Wavelength Digital Microscopic Image-Plane Holography[J]. Acta Optica Sinica, 2013, 33(10): 1009001
Paper Information
Category: Holography
Received: Apr. 19, 2013
Accepted: --
Published Online: Aug. 21, 2013
The Author Email: Yanan Zeng (ynzeng@tju.edu.cn)
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