13.5  nm Schwarzschild microscope with high magnification and high resolution

Shenghao Chen; Xin Wang; Qiushi Huang; Shuang Ma; Zhanshan Wang

doi:10.3788/COL201715.043401

Chinese Optics Letters, Volume. 15, Issue 4, 043401(2017)

13.5 nm Schwarzschild microscope with high magnification and high resolution

Shenghao Chen, Xin Wang, Qiushi Huang, Shuang Ma, and Zhanshan Wang^*

Key Laboratory of Advanced Micro-Structured Materials MOE, Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China

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Shenghao Chen, Xin Wang, Qiushi Huang, Shuang Ma, Zhanshan Wang, "13.5 nm Schwarzschild microscope with high magnification and high resolution," Chin. Opt. Lett. 15, 043401 (2017)

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Paper Information

Category: X-ray Optics

Received: Nov. 2, 2016

Accepted: Jan. 24, 2017

Published Online: Jul. 25, 2018

The Author Email: Zhanshan Wang (wangzs@tongji.edu.cn)

DOI:10.3788/COL201715.043401

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