Acta Optica Sinica, Volume. 20, Issue 1, 114(2000)

Time-Resolved Femtosecond Free-Induction-Decay in Semiconductor

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(6)

    [1] [1] Elsaesser T, Shah J, Rota L et al.. Initial thermalization of photoexited carriers in GaAs studied by femtosecond luminscence spectroscopy. Phys. Rev. Lett., 1991,66(13):1757~1760

    [2] [2] Becker P C, Fragnito H L, Brito Cruz C H et al.. Femtosecond photon echoes from band-to-band transitions in GaAs. Phys. Rev. Lett., 1988,61(14):1647~1649

    [4] [4] Worsley R E, Traynor N J, Grevatt T et al.. Transient linear birefringence in GaAs quantum wells: Magnetic field dependence of coherent exciton spin dynamics. Phys. Rev. Lett., 1996,76(17):3224~3227

    [5] [5] Planken P C M, van Son P C, Hovenier J N et al.. Far-infrared picosecond time-resolved measurement of the free-induction decay in GaAs: Si. Phys. Rev. (B), 1995, 51(15):9643~9647

    [6] [6] Whettet B S, Smirl A L, Boggess T F. Theory of degenerate four-wave mixing in picosecond exitation-probe experiments. IEEE J. Quant. Electron., 1983,QE-19(4):680~690

    [8] [8] Oudar J L, Hulin D, Migus A et al.. Subpicosecond spectral hole burning due to nonthermalized photoexcited carriers in GaAs. Phys. Rev. Lett., 1985,55(19):2074~2077

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Time-Resolved Femtosecond Free-Induction-Decay in Semiconductor[J]. Acta Optica Sinica, 2000, 20(1): 114

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 7, 1998

    Accepted: --

    Published Online: Aug. 9, 2006

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