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Acta Optica Sinica, Volume. 20, Issue 1, 114(2000)

Time-Resolved Femtosecond Free-Induction-Decay in Semiconductor

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Time-Resolved Femtosecond Free-Induction-Decay in Semiconductor[J]. Acta Optica Sinica, 2000, 20(1): 114

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 7, 1998

    Accepted: --

    Published Online: Aug. 9, 2006

    The Author Email:

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology