Microelectronics, Volume. 52, Issue 3, 478(2022)
A Measurement Method for Gate Charge Characteristics of MOSFET Under High Power Condition
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WANG Yanping, RONG Yu, CHEN Leilei, LI Jinxiao, FENG Huiwei, YAN Dawei. A Measurement Method for Gate Charge Characteristics of MOSFET Under High Power Condition[J]. Microelectronics, 2022, 52(3): 478
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Received: Sep. 10, 2021
Accepted: --
Published Online: Jan. 18, 2023
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