X-Ray Crystal Diffraction Spectrometer: Theory and Application

Miao Li; Tong Yao; Xi Wang; Jun Shi; Feng Wang; Guohong Yang; Wanli Shang; Minxi Wei; Ao Sun

doi:10.3788/AOS202242.1134008

Acta Optica Sinica, Volume. 42, Issue 11, 1134008(2022)

X-Ray Crystal Diffraction Spectrometer: Theory and Application

Miao Li¹, Tong Yao¹, Xi Wang¹, Jun Shi^2、*, Feng Wang³, Guohong Yang³, Wanli Shang³, Minxi Wei³, and Ao Sun³

Author Affiliations

¹College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China

²Key Laboratory of Optoelectronic Technology & Systems, Ministry of Education, Chongqing University, Chongqing 400044, China;

³Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, Sichuan, China

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Miao Li, Tong Yao, Xi Wang, Jun Shi, Feng Wang, Guohong Yang, Wanli Shang, Minxi Wei, Ao Sun. X-Ray Crystal Diffraction Spectrometer: Theory and Application[J]. Acta Optica Sinica, 2022, 42(11): 1134008

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Paper Information

Category: X-Ray Optics

Received: Jan. 27, 2022

Accepted: Mar. 3, 2022

Published Online: Jun. 3, 2022

The Author Email: Shi Jun (shijun@cqu.edu.cn)

DOI:10.3788/AOS202242.1134008

Topics

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