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Infrared Technology, Volume. 47, Issue 6, 671(2025)

Research on Reliability Evaluation Model and Accelerated Aging Demonstration of Infrared Detector Assembly

Kai ZHANG1,2, Haiying LI1,2、*, Dong LIU1, Yingxu ZHANG1, Shouzhang YUAN1,2, Peiyuan LI1, Hongfu LI1, Wenli ZHAO1,2, Yun ZHA1, and Yusong ZHAO1
Author Affiliations
  • 1Kunming Institute of Physics, Kunming 650223, China
  • 2National Key Laboratory of Infrared Detection, Kunming 650223, China
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    ZHANG Kai, LI Haiying, LIU Dong, ZHANG Yingxu, YUAN Shouzhang, LI Peiyuan, LI Hongfu, ZHAO Wenli, ZHA Yun, ZHAO Yusong. Research on Reliability Evaluation Model and Accelerated Aging Demonstration of Infrared Detector Assembly[J]. Infrared Technology, 2025, 47(6): 671

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    Paper Information

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    Received: Apr. 3, 2024

    Accepted: Jul. 3, 2025

    Published Online: Jul. 3, 2025

    The Author Email: LI Haiying (kryolhy@163.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology