Infrared Technology, Volume. 47, Issue 6, 671(2025)

Research on Reliability Evaluation Model and Accelerated Aging Demonstration of Infrared Detector Assembly

Kai ZHANG1,2, Haiying LI1,2、*, Dong LIU1, Yingxu ZHANG1, Shouzhang YUAN1,2, Peiyuan LI1, Hongfu LI1, Wenli ZHAO1,2, Yun ZHA1, and Yusong ZHAO1
Author Affiliations
  • 1Kunming Institute of Physics, Kunming 650223, China
  • 2National Key Laboratory of Infrared Detection, Kunming 650223, China
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    The increasing use of infrared detector components in military and space applications has generated growing demand for reliability assessments. However, the lack of standardized evaluation methods for component reliability and the challenges in assessing key reliability indicators pose complexities for research institutes. To address this issue, we conducted a comprehensive review of recent reliability assessment research conducted by leading foreign research institutions on infrared detectors, consolidated the results of accelerated life tests on primary subassemblies, and proposed several approaches to enhance the evaluability and precision of components, including conducting accelerated tests on key subassemblies: FPA, dewar and cooler, employing essential research methodologies such as standard usage profiles and acceleration factors, and integrating engineering expertise, theoretical techniques, statistical tools, and field data feedback to advance component reliability.

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    ZHANG Kai, LI Haiying, LIU Dong, ZHANG Yingxu, YUAN Shouzhang, LI Peiyuan, LI Hongfu, ZHAO Wenli, ZHA Yun, ZHAO Yusong. Research on Reliability Evaluation Model and Accelerated Aging Demonstration of Infrared Detector Assembly[J]. Infrared Technology, 2025, 47(6): 671

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    Paper Information

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    Received: Apr. 3, 2024

    Accepted: Jul. 3, 2025

    Published Online: Jul. 3, 2025

    The Author Email: LI Haiying (kryolhy@163.com)

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