Chinese Journal of Lasers, Volume. 51, Issue 7, 0701015(2024)
High-Precision Extreme Ultraviolet Reflectometry Based on Normalization
Fig. 4. Spectral response of two detectors as a function of injected electrical pulse energy from the light source
Fig. 6. Variation curves of reference and experimental beam energy decay over time
Fig. 7. Reflectivity measurement curves of Mo/Si multilayer mirror. (a) Reflectivity-angle curves before normalization; (b) reflectivity-angle curves after normalization
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Liangle Zhang, Xiaoquan Han, Wanlu Xie, Xiaobin Wu, Xuchen Fang, Zixiang Gao, Pengfei Sha, Kuibo Wang. High-Precision Extreme Ultraviolet Reflectometry Based on Normalization[J]. Chinese Journal of Lasers, 2024, 51(7): 0701015
Category: laser devices and laser physics
Received: Sep. 1, 2023
Accepted: Oct. 24, 2023
Published Online: Apr. 17, 2024
The Author Email: Wu Xiaobin (wuxiaobin@ime.ac.cn)
CSTR:32183.14.CJL231165