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Chinese Journal of Lasers, Volume. 46, Issue 8, 0804004(2019)

Measuring Refractive Index of Transparent Plate by Low-Coherent Interference

Bo Gao*, Qiang Li, Ang Liu, and Liqun Chai
Author Affiliations
  • Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China
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    References(15)

    [1] Shumate M S. Interferometric measurement of large indices of refraction[J]. Applied Optics, 5, 327-331(1966). http://www.ncbi.nlm.nih.gov/pubmed/20048842

    [2] Rosfjord K, Chang C, Miyakawa R et al. Direct index of refraction measurements at extreme-ultraviolet and soft-X-ray wavelengths[J]. Applied Optics, 45, 1730-1735(2006). http://europepmc.org/abstract/MED/16572688

    [3] Gillen G D, Guha S. Use of Michelson and Fabry-Perot interferometry for independent determination of the refractive index and physical thickness of wafers[J]. Applied Optics, 44, 344-347(2005). http://www.ncbi.nlm.nih.gov/pubmed/15717823

    [4] Tan T Y, Yi K, Shao J D. Measurement of refractive index of the optical crystal with spectrophotometer[J]. Chinese Journal of Lasers, 32, 1678-1682(2005).

    [5] Meng Q H, Xiang Y. Novel high accurate measurement method for refractive index of optical glass[J]. Optics and Precision Engineering, 16, 2114-2119(2008).

    [6] Song D S, Wang L, Xu R G et al. Refractive index measurement for quartz glass in ultraviolet band[J]. Journal of Applied Optics, 32, 705-708(2011).

    [7] Sun G L. A new refractive index measuring method[J]. Journal of Applied Optics, 16, 58-61(1995).

    [8] Wei R X, Jiang D S. Refractive index measurement with Fabry-Perot interference wavelength[J]. Chinese Journal of Lasers, 30, 551-554(2003).

    [9] Choi H J, Lim H H, Moon H S et al. Measurement of refractive index and thickness of transparent plate by dual-wavelength interference[J]. Optics Express, 18, 9429-9434(2010). http://www.ncbi.nlm.nih.gov/pubmed/20588789

    [10] Gillen G D, Guha S. Refractive-index measurements of zinc germanium diphosphide at 300 and 77 K by use of a modified Michelson interferometer[J]. Applied Optics, 43, 2054-2058(2004). http://www.opticsinfobase.org/abstract.cfm?id=79351

    [11] Hao D Z, Wu F Q, Kong W J. Measurement of refractive index of crystals with interferometry[J]. Laser Technology, 27, 407-408(2003).

    [12] Xiong F, Hu Z W, Jiang M D. Non-contact measurement of refractive index based on parallel surface plate[J]. Journal of Applied Optics, 33, 148-152(2012).

    [13] Xue H, Shen W D, Gu P F et al. Thickness measurement of thin film based on white-light spectral interferometry[J]. Acta Optica Sinica, 29, 1877-1880(2009).

    [14] Ma Y, Chen L, Zhu W H et al. Dynamic Twyman interferometer for phase defect measurement[J]. Chinese Journal of Lasers, 44, 1204009(2017).

    [15] Deng Q Y, Tang Y, Zhou Y et al. High-resolution surface topography measurement based on frequency-domain analysis in white light interferometry[J]. Chinese Journal of Lasers, 45, 0604001(2018).

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    Bo Gao, Qiang Li, Ang Liu, Liqun Chai. Measuring Refractive Index of Transparent Plate by Low-Coherent Interference[J]. Chinese Journal of Lasers, 2019, 46(8): 0804004

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    Paper Information

    Category: measurement and metrology

    Received: Feb. 27, 2019

    Accepted: Apr. 19, 2019

    Published Online: Aug. 13, 2019

    The Author Email: Gao Bo (48491061@qq.com)

    DOI:10.3788/CJL201946.0804004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology