Laser & Optoelectronics Progress, Volume. 60, Issue 24, 2412007(2023)
Detection of Surface Defects in Lightweight Insulators Using Improved YOLOv5
Fig. 5. Comparison diagrams before and after CA. (a) Original image; (b) before joining; (c) after joining
Fig. 6. Comparison before and after sparse training (a) Before sparse training; (b) after sparse training
Fig. 7. Comparison of different target detection algorithms. (a) Original image; (b) Faster R-CNN; (c) YOLOv3; (d) YOLOv5; (e) improved YOLOv5
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Yu Guo, Meiling Ma, Dalin Li. Detection of Surface Defects in Lightweight Insulators Using Improved YOLOv5[J]. Laser & Optoelectronics Progress, 2023, 60(24): 2412007
Category: Instrumentation, Measurement and Metrology
Received: Apr. 6, 2023
Accepted: May. 15, 2023
Published Online: Dec. 8, 2023
The Author Email: Yu Guo (1240366119@qq.com)