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Laser & Optoelectronics Progress, Volume. 60, Issue 24, 2412007(2023)

Detection of Surface Defects in Lightweight Insulators Using Improved YOLOv5

Yu Guo*, Meiling Ma, and Dalin Li
Author Affiliations
  • College of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
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    Article index updated: Sep. 12, 2025

    The article is cited by 6 article(s) CLP online library. (Some content might be in Chinese.)
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    Yu Guo, Meiling Ma, Dalin Li. Detection of Surface Defects in Lightweight Insulators Using Improved YOLOv5[J]. Laser & Optoelectronics Progress, 2023, 60(24): 2412007

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 6, 2023

    Accepted: May. 15, 2023

    Published Online: Dec. 8, 2023

    The Author Email: Yu Guo (1240366119@qq.com)

    DOI:10.3788/LOP231032

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology