Acta Photonica Sinica, Volume. 54, Issue 5, 0512001(2025)
Three-dimensional Shape Measurement Technology Based on Point Diffraction Interference
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Shiyu ZHAO, Fen GAO. Three-dimensional Shape Measurement Technology Based on Point Diffraction Interference[J]. Acta Photonica Sinica, 2025, 54(5): 0512001
Category: Instrumentation, Measurement and Metrology
Received: Oct. 18, 2024
Accepted: Dec. 24, 2024
Published Online: Jun. 18, 2025
The Author Email: Fen GAO (gaofen8128@163.com)