Acta Photonica Sinica, Volume. 54, Issue 5, 0512001(2025)

Three-dimensional Shape Measurement Technology Based on Point Diffraction Interference

Shiyu ZHAO and Fen GAO*
Author Affiliations
  • School of Optoelectronic Engineering,Xi'an Technological University,Xi'an 710021,China
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    References(21)

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    Shiyu ZHAO, Fen GAO. Three-dimensional Shape Measurement Technology Based on Point Diffraction Interference[J]. Acta Photonica Sinica, 2025, 54(5): 0512001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Oct. 18, 2024

    Accepted: Dec. 24, 2024

    Published Online: Jun. 18, 2025

    The Author Email: Fen GAO (gaofen8128@163.com)

    DOI:10.3788/gzxb20255405.0512001

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