Chinese Journal of Lasers, Volume. 29, Issue s1, 462(2002)
Analyses of Si-mirror Film Systems with High Reflectance at 1315 nm
References(3)
[1] [1] P. Baumeister. Dependence of the reflectance of a multiplayer reflector on the thickness of the outer layer. Appl. Opt., 1999, 38(28):6034～6035
[2] [2] Η. G. Lotz. Computer-aided multilayer design of optical filters with wide transmittance bands using SiO2 and TiQ2. Appl. Opt., 1987, 26(20): 4487～4490
[3] [3] Yin Shubai. Film Optics (Theory and Practice). Beijing: Science Press, 1987
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PENG Yu-feng, CHENG Zu-hai, ZHANG Yao-ning, ZHOU Ci-ming, YANG Chun-hua. Analyses of Si-mirror Film Systems with High Reflectance at 1315 nm[J]. Chinese Journal of Lasers, 2002, 29(s1): 462
Paper Information
Category: laser devices and laser physics
Received: --
Accepted: --
Published Online: Feb. 23, 2013
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