Chinese Journal of Lasers, Volume. 29, Issue s1, 462(2002)
Analyses of Si-mirror Film Systems with High Reflectance at 1315 nm
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PENG Yu-feng, CHENG Zu-hai, ZHANG Yao-ning, ZHOU Ci-ming, YANG Chun-hua. Analyses of Si-mirror Film Systems with High Reflectance at 1315 nm[J]. Chinese Journal of Lasers, 2002, 29(s1): 462
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Category: laser devices and laser physics
Received: --
Accepted: --
Published Online: Feb. 23, 2013
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CSTR:32186.14.
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