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Journal of Optoelectronics · Laser, Volume. 35, Issue 8, 851(2024)

Yarn-dyed fabric defect detection based on U-shaped attention gate auto-encoder

ZHANG Yue*, WANG Shihao, LI Yingjian, LIU Shuaibo, and ZHANG Hongwei
Author Affiliations
  • School of Electronics and Information, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China
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    ZHANG Yue, WANG Shihao, LI Yingjian, LIU Shuaibo, ZHANG Hongwei. Yarn-dyed fabric defect detection based on U-shaped attention gate auto-encoder[J]. Journal of Optoelectronics · Laser, 2024, 35(8): 851

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    Paper Information

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    Received: Jun. 19, 2023

    Accepted: Dec. 13, 2024

    Published Online: Dec. 13, 2024

    The Author Email: ZHANG Yue (zhangyue@xpu.edu.cn)

    DOI:10.16136/j.joel.2024.08.0324

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology