Infrared and Laser Engineering, Volume. 50, Issue 6, 20200460(2021)
Research on testing of active and passive HgCdTe APD detector in linear mode
Figures & Tables(19)
Fig. 1. (a) APD readout circuit Unit structure; (b) APD readout circuit working sequence
Fig. 9. (a) Circuit test sequence; (b) HgCdTe APD detector and circuit coupling test results
Table 1. Geiger and linear mode APD performance comparsion
View tableView in ArticleTable 1. Geiger and linear mode APD performance comparsion
Type GM-APD LM-APD Gain 105-106 10-103 Dynamic range Low High Quenching circuit Yes No Intensity information No Yes Continuous detection capability No Yes
Table 2. Readout circuit performance parameters
View tableView in ArticleTable 2. Readout circuit performance parameters
Parameter Description Technology TSMC 0.18 μm 1P6M CMOS Temperature/K 77 Pixel/μm2 50×50 Output swing/V 1.5-4 Power/mW 17.5
Table 3. Instrument parameters
View tableView in ArticleTable 3. Instrument parameters
Instrument Resolution Highest frequency 5122 14 bits 100 MHz 81150A 118.2 ps 5 MHz Agilent N6700B <1 mV -
Table 4. Circuit test conditions
View tableView in ArticleTable 4. Circuit test conditions
Parameter Value Temperature/K 77 Preamp CTIA bias voltage/V 1.5 Comparator voltage/V 3 Ramp frequency/K 200 Ramp delay/μs 1 Laser pulse width/μs 4.5 APD reverse bias voltage/V 2.5 (p=110 μW) Sampling frequency/MHz 100
Table 5. Performance parameters that affect TOF resolution
View tableView in ArticleTable 5. Performance parameters that affect TOF resolution
Type Sub-type Resolution System System noise 179 ps Ramp jitter 118.20 ps Voltage source error 135.36 ps@1 mV Circuit Capacitance deviation 100 ps@0.222 fF Output jitter(V2d) 24.335 ps@1 mV Output jitter(V3d) 833 ps@1 mV
Table 6. Comparison of the proposed work with the Sofradir test platform and test results
View tableView in ArticleTable 6. Comparison of the proposed work with the Sofradir test platform and test results
Proposed work Sofradir[ 14 ]Temperature/K 77 80 Laser:min step/ns 10 12.5 Ramp 200 ns max; slope 15 mV/ns 200 ns; slope 10 mV/ns A/D 14 bits; 2 V; 100 MHz 14 bits; 4 V; 100 kHz Resolution/cm 63.21 60
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Qiwen Zhang, Qinghua Liang, Huijun Guo, Honglei Chen, Ruijun Ding. Research on testing of active and passive HgCdTe APD detector in linear mode[J]. Infrared and Laser Engineering, 2021, 50(6): 20200460
Paper Information
Category: Infrared technology and application
Received: Jan. 3, 2021
Accepted: --
Published Online: Aug. 19, 2021
The Author Email: Honglei Chen (chenhl@mail.sitp.ac.cn), Ruijun Ding (dingrj@mail.sitp.ac.cn)
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