Research on testing of active and passive HgCdTe APD detector in linear mode

Qiwen Zhang; Qinghua Liang; Huijun Guo; Honglei Chen; Ruijun Ding

doi:10.3788/IRLA20200460

Infrared and Laser Engineering, Volume. 50, Issue 6, 20200460(2021)

Research on testing of active and passive HgCdTe APD detector in linear mode

Qiwen Zhang^1,2, Qinghua Liang¹, Huijun Guo¹, Honglei Chen^1、*, and Ruijun Ding^1、*

¹Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

²University of Chinese Academy of Sciences, Beijing 100049, China

show less

Abstract Get PDF(in Chinese)

Tools

Get Citation

Copy Citation Text

Qiwen Zhang, Qinghua Liang, Huijun Guo, Honglei Chen, Ruijun Ding. Research on testing of active and passive HgCdTe APD detector in linear mode[J]. Infrared and Laser Engineering, 2021, 50(6): 20200460

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Infrared technology and application

Received: Jan. 3, 2021

Accepted: --

Published Online: Aug. 19, 2021

The Author Email: Honglei Chen (chenhl@mail.sitp.ac.cn), Ruijun Ding (dingrj@mail.sitp.ac.cn)

DOI:10.3788/IRLA20200460

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology