Acta Optica Sinica, Volume. 42, Issue 11, 1134004(2022)

Frontier Development of X-ray Diffraction-Limited Nanofocusing

Hui Jiang1,2 and Aiguo Li1,2、*
Author Affiliations
  • 1Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
  • 2Shanghai Institute of Apply Physics, Chinese Academy of Sciences, Shanghai 201800, China
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    Figures & Tables(21)
    Development history of hard X-ray focusing below 100 nm in the last two decades
    Schematic diagram of zone plate[24]. (a) Structure of zone plate; (b) double zone plate resist template coated with Ir
    Schematic diagram of multilayer Laue lens. (a) Tilted multilayer Laue lens focusing; (b) optimization by wedged module
    Schematic diagram of refractive lens. (a) X-ray beam propagation in single refractive lens; (b) scanning electron microscope image of nanofocusing parabolic refractive X-ray lenses[49]
    Schematic diagram of Kinoform lens. (a) Schematic diagram of lens array with graded apertures[54]; (b) scanning electron microscope image of refractive lens with “fern-like” profile[53]
    Schematic diagram of K-B mirror focusing[58]. (a) K-B mirror with standard mode; (b) K-B mirror with Montel mode
    Schematic diagram of working principle of waveguide[78]. (a) Beam propagation in tapered waveguide; (b) experimental layout (entrance side of waveguide is located at focal plane of K-B mirror); (c) far-field imaging of exit beam
    Magnified Talbot self-imaging obtained by single-grating interferometer characterizing wavefront characteristics of focusing system
    Schematic diagrams of two kinds of one-dimensional speckle scanning measurement. (a) Upstream mode; (b) downstream mode
    Experiment based on speckle statistics[71]. (a) Experimental setup of speckle interferometry; (b) Speckle patterns and their autocorrelation functions
    Experimental diagram for characterization of focused beam produced by K-B mirror[113]
    Reconstruction of sample and incident wavefront by ptychography[114]. (a) Sample; (b) incident wavefront
    Schematic diagram of iterative phase retrieval method. (a) Wavefront in vicinity of beam waist and diffracted X-ray recorded by detector in dark field[118]; (b) phase iterative realized by angular spectrum propagation between multiple wavefronts near focal spot[83]
    Wavefront aberrations of shape of K-B mirror before and after correction[119]. (a) Horizontal focusing mirror; (b) vertical focusing mirror
    Working principle of piezoelectric deformable focusing mirror. (a) Schematic diagram of piezoelectric deformable focusing mirror; (b) piezoresponse functions of piezoelectric deformable mirror with 18 channels
    Schematic diagram of phase compensation mirror developed by Osaka university[133]
    Effect of phase compensation mirror on focusing. (a) Perfect focusing obtained by deformable mirror; (b) comparison of surface profile of deformable mirror (upper) and focal spot size (lower) before and after phase compensation[66]
    Wavefront compensation of beryllium compound refractive lens realized by using phase plate[138]. (a) Deformation of every lens surface; (b) comparison between surface profile and design goal of SiO2 phase plate
    Schematic diagram of two structure sequences of refractive phase plate[140]
    • Table 1. Comparison of main hard X-ray focusing optics

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      Table 1. Comparison of main hard X-ray focusing optics

      ItemZone plateMultilayerLaue lensCompoundrefractive lensMultilayerK-B mirrorWaveguide
      Minimal spot size /nm7.86.8145.810
      EfficiencyLowRelatively highRelatively lowHighRelatively high
      MechanismSimpleSimpleSimpleRelatively complexRelatively complex
      DisadvantageLow efficiencyShort workingdistanceLow efficiency inlow energy regimeDifficult adjustment,monochromatizationNo workingdistance
    • Table 2. Comparison of common on-line X-ray wavefront detection techniques

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      Table 2. Comparison of common on-line X-ray wavefront detection techniques

      ItemGrating interferometerNear-field specklePtychographyIterative phase retrieval
      CoherenceLowMediumHighHigh
      OpticsGrating (one-dimensional ortwo-dimensional)Sandpaper(two-dimensional)Sample(two-dimensional)Mirco-bridgeknife
      Experimental setupComplexSimpleSimpleSimple
      Measurement modeSingle or scanSingle or scanScanScan
      Data processingFastRelatively fastSlowRelatively slow
      Measurement objectSlope or curvatureSlope or curvaturePhasePhase
      Dark field informationFringe visibilityCross correlation
      Angular resolutionRelatively highRelatively highHighHigh
      Main disadvantageComplex setup,expensive optics,phase wrappingSlow data processingfor two-dimensionalmappingHigh coherence,slow data processingHigh-precision knife,high coherence,slow data processing
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    Hui Jiang, Aiguo Li. Frontier Development of X-ray Diffraction-Limited Nanofocusing[J]. Acta Optica Sinica, 2022, 42(11): 1134004

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    Paper Information

    Category: X-Ray Optics

    Received: Feb. 9, 2022

    Accepted: Mar. 28, 2022

    Published Online: Jun. 3, 2022

    The Author Email: Aiguo Li (liaiguo@zjlab.org.cn)

    DOI:10.3788/AOS202242.1134004

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