[1] Hu H L, He L, Zhang Y et al. Imaging experiments for weak small target in low-light-level background[J]. Infrared and Laser Engineering, 49, 20190569(2020).

[2] Huang Y D. Fusion of infrared and low-level light images in realistic scene[D](2018).

[3] Tao Y Y. Performance evaluation of infrared and low light level fusion night vision system[D](2015).

[4] Xie Y B, Xu N T, Zhou S et al. Super-resolution image reconstruction of distributed infrared array camera[J]. Laser & Optoelectronics Progress, 59, 1611004(2022).

[5] Wang T T. Fabrication of hard infrared anti-reflection coating with broadband in the wavelength of 0.8-1.7 μm and 3.7-4.8 μm based on oxide material[J]. Chinese Optics, 7, 816-822(2014).

[6] Zhang T X, Li Q T, He G Z et al. Research of hard protective infrared coatings on ZnS substrate[J]. Optics & Optoelectronic Technology, 13, 50-53(2015).

[7] Mi G Y, Zhang J F, Han J et al. Research on antireflection coating for TV, laser, mid-infrared wavebands[J]. Laser & Infrared, 46, 593-596(2016).

[8] Jiang H Y. Development of short and medium wave infrared imaging system optical coating[D](2018).

[9] Fleming L, Gibson D, Song S G et al. Reducing N2O induced cross-talk in a NDIR CO2 gas sensor for breath analysis using multilayer thin film optical interference coatings[J]. Surface and Coatings Technology, 336, 9-16(2018).

[10] Guo M, Yi K, Cui X Q et al. Design and preparation of UV-visible-shortwave near infrared cut-off and mid-infrared antireflection coating[J]. Optik, 227, 165470(2021).

[11] Xing Z, Fu X H, Fu J J et al. Interference filter of reflectance in 650 nm and transmittance in 10.6 μm[J]. Laser & Infrared, 38, 482-484(2008).

[12] Zhao X M. Research of long-wavelength pass filter[D](2004).

[13] Tang J F, Gu P F, Liu X[M]. Modern optical thin film technology(2006).

[14] Feng Y D, Yu T Y, Liu D Q. Influence of deposition process on reliability of YbF3 thin films[J]. Acta Optica Sinica, 38, 0731002(2018).

[15] Qin Y, Zhang R F. Investigation on the preparation of YbF3 films at different temperatures[J]. Optical Instruments, 40, 90-94(2018).

[16] Chen T, Luo C T, Wang D S et al. Influence of ion beam assistance deposition and annealing on stress in ZnS films[J]. Chinese Journal of Vacuum Science and Technology, 29, 55-58(2009).

[17] Zhu J T, Guo S, Zhao J L et al. Microstructure and stress of Zr thin film deposited by pulsed DC sputtering[J]. Acta Optica Sinica, 41, 1831001(2021).