Chinese Journal of Lasers, Volume. 51, Issue 18, 1801017(2024)
Layer Classification Algorithm in Terahertz Thickness Measurement Technology
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Jie Lin, Ji Qi, Yuqi Zhang, Wei Zhang, Yuang Chen, Mingxia He, Qiuhong Qu, Yizhu Zhang. Layer Classification Algorithm in Terahertz Thickness Measurement Technology[J]. Chinese Journal of Lasers, 2024, 51(18): 1801017
Category: laser devices and laser physics
Received: Jun. 12, 2024
Accepted: Jul. 22, 2024
Published Online: Sep. 9, 2024
The Author Email: Zhang Yizhu (zhangyizhu@tju.edu.cn)
CSTR:32183.14.CJL240955